SHR-1000

SHR-1000 is a fast, non-contact and reliable alternative of four point probe in the characterization of emitter layers. Emitter sheet resistance is a primary quality control parameter for silicon cells in PV applications.

Features and System specifications:

• Non-contact
• Preparation free
• Applicable on coated samples (phosphorous glass)
• High speed
• Production line compatible
• Alternative method to the traditional four-point-probe
• Detection of shunts
• Including software and PC
• High speed
• Production line compatible
• Optional reflectance measurement
• Range: 10-200 Ω/sq