WxL

WML

Carrier lifetime is a primary quality control parameter for silicon wafers in PV applications. The WML models, WML-1 & WML-3, Lifetime Testers allow measurement of wafers “on the fly," i.e., conveyor belt does not stop during measurement. Therefore, they have the high throughput that meets the requirements of in-line quality control in fully automated wafer and cell production lines.

WLL

FAST NON-CONTACT MATERIAL CHARACTERIZATION AND PROCESS CONTROL

Carrier lifetime is a primary quality control parameter for silicon wafers in PV applications. The WLL models, WLL-1, -3 & -5 In-Line Lifetime Testers allow measurement of lifetime at 1, 3 or 5 points with the high throughput that meets the requirements of in-line quality control in fully automated wafer production lines.

• measurement technique: µ-PCD
• sample size: 100 to 210 mm
• measurement position: adjustable
• probe height above transport belt: 4 mm
• sample support: on belt