WT-2000MCT

Temperature Dependent Lifetime Measurements for Characterization of Narrow-Band Semiconductors

The WT-2000MCT is a special design for µ-PCD lifetime measurement at different sample temperatures.

Features and System Specifications:

• Sample size: maximum 100 mm in diameter
• Temperature range: from 80 K to 325 K
• Cooling time: < 0.2 K

Operating modes:

• Whole wafer mapping at a preselected stabilized temperature
• Single-point lifetime scan as a function of temperature

Applications:

• Minority carrier lifetime as a function of temperature
• Excels in measuring lifetime in narrow band semiconductors, where excess carriers are thermally excited at room temperature
• Materials: HgCdTe, InSb, GaAs, etc.