LST-2500HD Light Scattering Tomograph High Dynamic-range System

  LST-2500HD
Area of application Wafer fabs / R&D
Wafer handling Automated loading
Sample positioning

Advanced autofocus mechanism

Scanning range

Whole wafer diameter scan**

Evaluation

Automatic evaluation parallel with measurements

Denuded zone

DZ determination from one image

Reporting functions (single point)

Density, size depth profile, size histogram

Reporting functions (radial scan)

Average density, average size, DZ radial distribution

**excluding bad edge area

Request Info

Technology