TTR-300

The Solar Cell Wafer Topology Measurement system is a complete system for thickness, resistivity and two-sided saw mark measurements.

Features and System specifications:

• Thickness measurement - 6 lines of thickness detection
• Resistivity measurement - 1 line of resistivity measurement along the center line of the wafer with a non-contact Eddy current type sensor.
• P/N determination - conductivity type (P or N) is measured in one point in the middle of the wafer with a non-contact SPV sensor.
• Saw mark - 6 lines of saw mark detection
• The data are transferred to the Data Collector PC